Advanced Techniques for Assessment Surface Topography

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Authors: Liam Blunt, Xiang Jiang
Publisher: Butterworth-Heinemann
Genre: Unknown
Pages: 364
Language: english
Year: 2003
ISBN 10: 1903996112
ISBN 13: 9781903996119
Series: Unknown
Edition: Unknown
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Synopsis

This publication deals with the latest developments in the field of 3D surface metrology and will become a seminal text in this important area. It has been prepared with the support of the European Community's Directorate General XII and represents the...