Electrical Overstress (EOS): Devices, Circuits and Systems

(4.6/5) - 394 ratings
Author: Steven H. Voldman
Publisher: Wiley
Genre: Unknown
Pages: 368
Language: english
Year: 2013
ISBN 10: 1118511883
ISBN 13: 9781118511886
Series: EOS
Edition: 1
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Electrical Overstress (EOS) continues to impact semiconductor manufacturing, semiconductor components and systems as technologies scale from micro- to nano-electronics.  This bookteaches the fundamentals of electrical overstress  and how to minimize and mitigate EOS failures. The text provides a clear picture...